2017年4月17日，阿肯色大学张杨博士受袁永波教授邀访问研究所 Dr. Zhang Yang of University of Arkansas is invited by Professor Yongbo Yuan to visit the Institute.
2017年4月17日，阿肯色大学张杨博士受袁永波教授邀访问研究所，并做了邀请报告“Solution-processed Semiconductors: Optoelectronic Properties and Applications”。
张杨博士，湖南浏阳人。2003年毕业于四川大学物理学院微电子与固体电子学专业获理学学士学位。同年保送至中国科学院半导体研究所超晶格室师从杨富华研究员继续研究生阶段学习，并于2008年获微电子与固体电子学专业工学博士学位。2009年至今先后在意大利技术研究所，美国威斯康辛大学密尔沃基分校，内布拉斯加大学林肯分校，以及阿肯色大学从事博士后研究工作。他现在的主要研究兴趣包括超高灵敏度的光电以及射线探测器，半导体纳米材料的光学和电学输运性质表征，基于纳米材料的高灵敏度气体传感器，半导体微纳加工技术，以及半导体表征和测试设备研制。近年来，他以第一作者或通讯作者在Nature Photonics，AdvancedMaterials，Nanoscale，和ACSAppliedMaterials&Interfaces等国际期刊上发表多篇学术论文。
Dr. Zhang Yang of University of Arkansas is invited by Professor Yongbo Yuan to visit the Institute and gave an invited report entitled “Solution-processed Semiconductors: Optoelectronic Properties and Applications”.
Dr. Zhang Yang, Liuyang, Hunan, graduated from Sichuan University in 2003 with a Bachelor of Science Degree in microelectronics and solid state electronics. In the same year, he was sent to the superlattice room of the semiconductor Research Institute of the Chinese Academy of Sciences. He continued to study at the postgraduate stage under Yang Fuhua researcher and received his doctorate degree in microelectronics and solid state electronics in 2008. Since 2009, he has been engaged in postdoctoral research at the Italy Institute of technology, the University of Wisconsin, the University of Milwaukee, the University of Nebraska-Lincoln, and the University of Arkansas. His main research interests include ultra high sensitivity photoelectric and ray detectors, characterization of optical and electrical transport properties of semiconductor nanomaterials, high sensitivity gas sensors based on nanomaterials, semiconductor micromachining technology, and semiconductor characterization and testing equipment.